[E-3-5] Dynamics of the Charge Centroid in MONOS Memory Cells during Avalanche Injection and FN Injection Based on Incremental-Step-Pulse-Programming

J. Fujiki¹、T. Haimoto¹、N. Yasuda¹、M. Koyama¹ (1.TOSHIBA Corp. , Japan)

https://doi.org/10.7567/SSDM.2010.E-3-5