Microstructural Characterization in Reliability Measurement of PRAM

2010 International Conference on Solid State Devices and Materials

Sep 21, 2010 - Sep 24, 2010
The University of Tokyo, Tokyo, Japan

J. Bae¹, K. Hwang¹, K. Park¹, S. Jeon¹, D. H. Kang¹, S. Park¹, J. Ahn¹, S. Kim¹, G. Jeong¹, C. Chung¹ (1.Samsung Electronics Co., Ltd. , Korea)