[E-8-5L] Microstructural Characterization in Reliability Measurement of PRAM

J. Bae¹、K. Hwang¹、K. Park¹、S. Jeon¹、D. H. Kang¹、S. Park¹、J. Ahn¹、S. Kim¹、G. Jeong¹、C. Chung¹ (1.Samsung Electronics Co., Ltd. , Korea)

https://doi.org/10.7567/SSDM.2010.E-8-5L