KFM Observation of Single-Electron Filling in Isolated and Clustered Dopants

M. Anwar; D. Moraru; M. Ligowski; T. Mizuno; R. Jablonski; Y. Ono; M. Tabe

doi:https://doi.org/10.7567/SSDM.2010.F-2-5

2010 International Conference on Solid State Devices and Materials

2010年9月21日〜 2010年9月24日
The University of Tokyo, Tokyo, Japan

[F-2-5] KFM Observation of Single-Electron Filling in Isolated and Clustered Dopants

M. Anwar¹、D. Moraru¹、M. Ligowski^1,2、T. Mizuno¹、R. Jablonski²、Y. Ono³、M. Tabe¹ (1.Shizuoka Univ. , Japan、2.Warsaw Univ. of Tech. , Poland、3.NTT Basic Res. Labs. , Japan)

https://doi.org/10.7567/SSDM.2010.F-2-5

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