KFM Observation of Single-Electron Filling in Isolated and Clustered Dopants

M. Anwar; D. Moraru; M. Ligowski; T. Mizuno; R. Jablonski; Y. Ono; M. Tabe

doi:https://doi.org/10.7567/SSDM.2010.F-2-5

2010 International Conference on Solid State Devices and Materials

Sep 21, 2010 - Sep 24, 2010
The University of Tokyo, Tokyo, Japan

[F-2-5] KFM Observation of Single-Electron Filling in Isolated and Clustered Dopants

M. Anwar¹, D. Moraru¹, M. Ligowski^1,2, T. Mizuno¹, R. Jablonski², Y. Ono³, M. Tabe¹ (1.Shizuoka Univ. , Japan, 2.Warsaw Univ. of Tech. , Poland, 3.NTT Basic Res. Labs. , Japan)

https://doi.org/10.7567/SSDM.2010.F-2-5

▲