The Japan Society of Applied Physics

[F-5-5] Drive Current Enhancement with Invasive Source in Double Gate Tunneling Field-Effect Transistors

Y. Yang1, P. F. Guo1, G. Q. Han1, C. L. Zhan1, L. Fan1, Y. C. Yeo1 (1.National Univ. of Singapore , Singapore)

https://doi.org/10.7567/SSDM.2010.F-5-5