[I-5-3] The Unique Phenomenon in the Amorphous In₂O₃-Ga₂O₃-ZnO TFTs Degradation under the Dynamic Stress

M. Fujii¹, J. S. Jung², J. Y. Kwon², Y. Uraoka^1,3 (1.NAIST , Japan, 2.Samsung Advanced Inst. of Tech. , Korea, 3.CREST-JST , Japan)

https://doi.org/10.7567/SSDM.2010.I-5-3