[I-5-3] The Unique Phenomenon in the Amorphous In₂O₃-Ga₂O₃-ZnO TFTs Degradation under the Dynamic Stress

M. Fujii¹、J. S. Jung²、J. Y. Kwon²、Y. Uraoka^1,3 (1.NAIST , Japan、2.Samsung Advanced Inst. of Tech. , Korea、3.CREST-JST , Japan)

https://doi.org/10.7567/SSDM.2010.I-5-3