The Japan Society of Applied Physics

[I-7-3] Impact of Interface States and Bulk Carrier Lifetime on Photocapacitance of Metal/Insulator/GaN Structure

P. Bidzinski1, M. Miczek1, B. Admowicz1, C. Mizue2, T. Hashizume2 (1.Silesian Univ. of Tech., , Poland, 2.Hokkaido Univ. , Japan)

https://doi.org/10.7567/SSDM.2010.I-7-3