[I-7-3] Impact of Interface States and Bulk Carrier Lifetime on Photocapacitance of Metal/Insulator/GaN Structure

P. Bidzinski¹、M. Miczek¹、B. Admowicz¹、C. Mizue²、T. Hashizume² (1.Silesian Univ. of Tech., , Poland、2.Hokkaido Univ. , Japan)

https://doi.org/10.7567/SSDM.2010.I-7-3