[J-1-2] Characterization of Carbon Nanotube Thin Film Transistors by Scanning Probe Microscopy

Y. Okigawa¹, Y. Ohno¹, S. Kishimoto¹, T. Mizutani¹ (1.Nagoya Univ. , Japan)

https://doi.org/10.7567/SSDM.2010.J-1-2