The Japan Society of Applied Physics

[K-3-3] Effects of surface and crystalline defects on reverse characteristics of 4H-SiC JBS diodes

T. Katsuno1, Y. Watanabe1, H. Fujiwara2, M. Konishi2, T. Yamamoto3, T. Endo3 (1.Toyota Central R&D Labs., Inc., 2.Toyota Motor Corp., 3.DENSO Corp. , Japan)

https://doi.org/10.7567/SSDM.2010.K-3-3