The Japan Society of Applied Physics

[K-3-3] Effects of surface and crystalline defects on reverse characteristics of 4H-SiC JBS diodes

T. Katsuno1、Y. Watanabe1、H. Fujiwara2、M. Konishi2、T. Yamamoto3、T. Endo3 (1.Toyota Central R&D Labs., Inc.、2.Toyota Motor Corp.、3.DENSO Corp. , Japan)

https://doi.org/10.7567/SSDM.2010.K-3-3