[K-3-3] Effects of surface and crystalline defects on reverse characteristics of 4H-SiC JBS diodes

T. Katsuno¹、Y. Watanabe¹、H. Fujiwara²、M. Konishi²、T. Yamamoto³、T. Endo³ (1.Toyota Central R&D Labs., Inc.、2.Toyota Motor Corp.、3.DENSO Corp. , Japan)

https://doi.org/10.7567/SSDM.2010.K-3-3