[P-1-7] Analysis of Local Leakage Current of Pr Oxide Thin Films with Conductive Atomic Force Microscopy

M. Adachi¹, M. Sakashita¹, H. Kondo¹, W. Takeuchi¹, O. Nakatsuka¹, S. Zaima¹ (1.Nagoya Univ. , Japan)

https://doi.org/10.7567/SSDM.2010.P-1-7