[P-1-7] Analysis of Local Leakage Current of Pr Oxide Thin Films with Conductive Atomic Force Microscopy

M. Adachi¹、M. Sakashita¹、H. Kondo¹、W. Takeuchi¹、O. Nakatsuka¹、S. Zaima¹ (1.Nagoya Univ. , Japan)

https://doi.org/10.7567/SSDM.2010.P-1-7