[P-3-1] Experimental Investigations on Ballistic Transport in Multi-Bridged Channel Field Effect Transistors (MBCFETs)

Y. C. Jung¹, B. H. Hong¹, L. Choi¹, S. W. Hwang¹, K. H. Cho², S. Y. Lee², D. W. Kim², G. Y. Jin², K. S. Oh² (1.Korea Univ., 2.Samsung Electronics Co., Ltd. , Korea)

https://doi.org/10.7567/SSDM.2010.P-3-1