Experimental Investigations on Ballistic Transport in Multi-Bridged Channel Field Effect Transistors (MBCFETs)

Y. C. Jung; B. H. Hong; L. Choi; S. W. Hwang; K. H. Cho; S. Y. Lee; D. W. Kim; G. Y. Jin; K. S. Oh

doi:https://doi.org/10.7567/SSDM.2010.P-3-1

[P-3-1] Experimental Investigations on Ballistic Transport in Multi-Bridged Channel Field Effect Transistors (MBCFETs)

Y. C. Jung¹、B. H. Hong¹、L. Choi¹、S. W. Hwang¹、K. H. Cho²、S. Y. Lee²、D. W. Kim²、G. Y. Jin²、K. S. Oh² (1.Korea Univ.、2.Samsung Electronics Co., Ltd. , Korea)

https://doi.org/10.7567/SSDM.2010.P-3-1

2010 International Conference on Solid State Devices and Materials

[P-3-1] Experimental Investigations on Ballistic Transport in Multi-Bridged Channel Field Effect Transistors (MBCFETs)