[P-4-2] Effect of MIM type selection device on readout margin of cross-point bipolar ReRAM

J. Shin¹、I. Kim¹、J. Park¹、J. Lee¹、M. Jo¹、K. P. Biju¹、S. Jung¹、W. Lee¹、S. Kim¹、S. Park¹、D. Lee¹、H. Hwang¹ (1.Gwangju Inst. of Sci. and Tech. , Korea)

https://doi.org/10.7567/SSDM.2010.P-4-2