[P-9-13] Analysis of MOSFET Electrometer Sensitivity by Radio-Frequency Reflection

M. Kawai¹, V. Singh¹, M. Nagasaka¹, H. Satoh¹, H. Inokawa¹ (1.Shizuoka Univ. , Japan)

https://doi.org/10.7567/SSDM.2010.P-9-13