[P-9-13] Analysis of MOSFET Electrometer Sensitivity by Radio-Frequency Reflection

M. Kawai¹、V. Singh¹、M. Nagasaka¹、H. Satoh¹、H. Inokawa¹ (1.Shizuoka Univ. , Japan)

https://doi.org/10.7567/SSDM.2010.P-9-13