A Simple Thermal Impedance Measurement of SiC JFETs with Constant Current Operation

2011 International Conference on Solid State Devices and Materials

Sep 27, 2011 - Sep 30, 2011
Aichi Industry & Labor Center (WINC AICHI), Nagoya, Japan

T. Kim¹, T. Funaki¹ (1.Osaka Univ. , Japan)