UV-Ozone Effect of the Organic Thin Film Transistor with PVP Gate Dielectric in Low Temperature

H. J. Yun; K. H. Baek; L. M. Do; S. Y. Lee; K. S. Jeong; Y. M. Kim; S. D. Yang; H. D. Lee; G. W. Lee

doi:https://doi.org/10.7567/SSDM.2011.B-3-3

2011 International Conference on Solid State Devices and Materials

Sep 27, 2011 - Sep 30, 2011
Aichi Industry & Labor Center (WINC AICHI), Nagoya, Japan

[B-3-3] UV-Ozone Effect of the Organic Thin Film Transistor with PVP Gate Dielectric in Low Temperature

H. J. Yun¹, K. H. Baek², L. M. Do², S. Y. Lee¹, K. S. Jeong¹, Y. M. Kim¹, S. D. Yang¹, H. D. Lee¹, G. W. Lee¹ (1.Chungnam National Univ., 2.ETRI , Korea)

https://doi.org/10.7567/SSDM.2011.B-3-3

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