Random Trap Fluctuation (RTF) Induced Vth Variability and the Impact on the Reliability of Strained-Silicon CMOS Devices

2011 International Conference on Solid State Devices and Materials

Sep 27, 2011 - Sep 30, 2011
Aichi Industry & Labor Center (WINC AICHI), Nagoya, Japan

E. R. Hsieh¹, C. Y. Cheng¹, S. S. Chung¹, C. H. Tsai², R. M. Huang², C. T. Tsai², C. W. Liang² (1.National Chiao Tung Univ., 2.UMC , Taiwan)