Random Trap Fluctuation (RTF) Induced Vth Variability and the Impact on the Reliability of Strained-Silicon CMOS Devices

2011 International Conference on Solid State Devices and Materials

2011年9月27日〜 2011年9月30日
Aichi Industry & Labor Center (WINC AICHI), Nagoya, Japan

E. R. Hsieh¹、C. Y. Cheng¹、S. S. Chung¹、C. H. Tsai²、R. M. Huang²、C. T. Tsai²、C. W. Liang² (1.National Chiao Tung Univ.、2.UMC , Taiwan)