[D-5-3] Uniaxial Strain Effect on Flicker Noise and Random Telegraph Noise of SiC Strained nMOSFETs in 40nm Technology

K. L. Yeh¹, C. S. Chang¹, J. C. Guo¹ (1.National Chiao Tung Univ. , Taiwan)

https://doi.org/10.7567/SSDM.2011.D-5-3