[D-8-4] Enhanced Degradation by NBT stress in Si Nanowire Transistor

K. Ota¹, M. Saitoh¹, C. Tanaka¹, Y. Nakabayashi¹, K. Uchida², T. Numata¹ (1.Toshiba Corp., 2.Tokyo Tech , Japan)

https://doi.org/10.7567/SSDM.2011.D-8-4