[D-8-4] Enhanced Degradation by NBT stress in Si Nanowire Transistor

K. Ota¹、M. Saitoh¹、C. Tanaka¹、Y. Nakabayashi¹、K. Uchida²、T. Numata¹ (1.Toshiba Corp.、2.Tokyo Tech , Japan)

https://doi.org/10.7567/SSDM.2011.D-8-4