The Japan Society of Applied Physics

[E-7-4] Characterization of strain and crystallinity in patterned embedded Silicon Germanium structures

S. Mochizuki1、A. Madan2、A. Pofelski3、A. G. Domenicucci2、P. L. Flaitz2、J. Li2、Y. Y. Wang2、T. Pinto2、C. W. Lai4、J. R. Holt2、E. C. T. Harley2、M. W. Stoker2、A. Reznicek2、D. Schepis2、V. Paruchuri2 (1.Renesas Electronics、2.IBM、3.STMicroelectronics、4.GLOBALFOUNDRIES Singapore , USA)

https://doi.org/10.7567/SSDM.2011.E-7-4