The Japan Society of Applied Physics

[F-4-2] Practical Consideration of Endurance and Performance for sub-90 nm Embedded 2T-FN Flash Memory beyond Smart Card IC

Y. K. Lee1, B. Seo1, J. Park1, C. Jeon1, Y. Jeong1, S. B. Ryu1, H. Yoo1, Y. Kim1, J. U. Han1, E. Jung1 (1.Samsung Electronics Co., Ltd. , Korea)

https://doi.org/10.7567/SSDM.2011.F-4-2