[F-4-2] Practical Consideration of Endurance and Performance for sub-90 nm Embedded 2T-FN Flash Memory beyond Smart Card IC

Y. K. Lee¹, B. Seo¹, J. Park¹, C. Jeon¹, Y. Jeong¹, S. B. Ryu¹, H. Yoo¹, Y. Kim¹, J. U. Han¹, E. Jung¹ (1.Samsung Electronics Co., Ltd. , Korea)

https://doi.org/10.7567/SSDM.2011.F-4-2