[F-4-2] Practical Consideration of Endurance and Performance for sub-90 nm Embedded 2T-FN Flash Memory beyond Smart Card IC

Y. K. Lee¹、B. Seo¹、J. Park¹、C. Jeon¹、Y. Jeong¹、S. B. Ryu¹、H. Yoo¹、Y. Kim¹、J. U. Han¹、E. Jung¹ (1.Samsung Electronics Co., Ltd. , Korea)

https://doi.org/10.7567/SSDM.2011.F-4-2