Recovery based nanowire field-effect transistor detection of pathogenic avian influenza DNA

C. H. Lin; K. N. Teng; C. J. Chu; C. D. Chen; L. C. Tsai; Y. S. Yang

doi:https://doi.org/10.7567/SSDM.2011.H-6-5

2011 International Conference on Solid State Devices and Materials

Sep 27, 2011 - Sep 30, 2011
Aichi Industry & Labor Center (WINC AICHI), Nagoya, Japan

[H-6-5] Recovery based nanowire field-effect transistor detection of pathogenic avian influenza DNA

C. H. Lin¹, K. N. Teng¹, C. J. Chu^2,3, C. D. Chen², L. C. Tsai³, Y. S. Yang¹ (1.National Chiao Tung Univ., 2.Academia Sinica, 3.National Taipei Univ. of Tech. , Taiwan)

https://doi.org/10.7567/SSDM.2011.H-6-5

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