Recovery based nanowire field-effect transistor detection of pathogenic avian influenza DNA

C. H. Lin; K. N. Teng; C. J. Chu; C. D. Chen; L. C. Tsai; Y. S. Yang

doi:https://doi.org/10.7567/SSDM.2011.H-6-5

2011 International Conference on Solid State Devices and Materials

2011年9月27日〜 2011年9月30日
Aichi Industry & Labor Center (WINC AICHI), Nagoya, Japan

[H-6-5] Recovery based nanowire field-effect transistor detection of pathogenic avian influenza DNA

C. H. Lin¹、K. N. Teng¹、C. J. Chu^2,3、C. D. Chen²、L. C. Tsai³、Y. S. Yang¹ (1.National Chiao Tung Univ.、2.Academia Sinica、3.National Taipei Univ. of Tech. , Taiwan)

https://doi.org/10.7567/SSDM.2011.H-6-5

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