[J-8-6L] Correlation measurement of 1/f noise in semiconductor point contacts with a common lead

M. Yamagishi¹、M. Hashisaka¹、K. Muraki²、T. Fujisawa¹ (1.Tokyo Tech、2.NTT Basic Res. Labs. , Japan)

https://doi.org/10.7567/SSDM.2011.J-8-6L