[J-8-6L] Correlation measurement of 1/f noise in semiconductor point contacts with a common lead

M. Yamagishi¹, M. Hashisaka¹, K. Muraki², T. Fujisawa¹ (1.Tokyo Tech, 2.NTT Basic Res. Labs. , Japan)

https://doi.org/10.7567/SSDM.2011.J-8-6L