[K-2-1] Resistance distribution of CNT network measured by conductive atomic force microscopy

K. Housayama¹, Y. Okigawa¹, S. Kishimoto¹, Y. Ohno¹, T. Mizutani¹ (1.Nagoya Univ. , Japan)

https://doi.org/10.7567/SSDM.2011.K-2-1