[L-8-6] Dynamic-Carrier-Distribution-Based Compact Modeling of P-i-N Diode Reverse Recovery Effect

J. Nakashima¹、M. Miyake¹、M. Miura-Mattausch¹ (1.Hiroshima University , Japan)

https://doi.org/10.7567/SSDM.2011.L-8-6