[P-1-7] Estimation of breakdown electric-field strength reflecting local structures of SiO2 by using first-principles molecular orbital calculation technique
H. Seki1、Y. Shibuya2、D. Kobayashi3、H. Nohira2、K. Yasuoka1、K. Hirose3
(1.Keio Univ.、2.Tokyo City Univ.、3.ISAS/JAXA , Japan)
https://doi.org/10.7567/SSDM.2011.P-1-7
