[P-1-7] Estimation of breakdown electric-field strength reflecting local structures of SiO2 by using first-principles molecular orbital calculation technique
H. Seki1, Y. Shibuya2, D. Kobayashi3, H. Nohira2, K. Yasuoka1, K. Hirose3
(1.Keio Univ., 2.Tokyo City Univ., 3.ISAS/JAXA , Japan)
https://doi.org/10.7567/SSDM.2011.P-1-7
