Analysis of FET Operation Mechanism in SWNT Networks Using Scanning Gate Microscopy

2011 International Conference on Solid State Devices and Materials

Sep 27, 2011 - Sep 30, 2011
Aichi Industry & Labor Center (WINC AICHI), Nagoya, Japan

X. Wei¹, K. Maeda¹, T. Yahagi¹, S. Shimozono¹, M. Matsunaga¹, N. Aoki¹, J. P. Bird², Y. Ochiai¹ (1.Chiba Univ. , Japan, 2.Univ. at Buffalo , USA)