Investigation of Temperature Dependence on DC and Low-Frequency Noise Characteristics in Uniaxial Tensile Strained nMOSFETs

S. C. Tsai; S. L. Wu; J. F. Chen; S. J. Chang; C. Y. Chang; P. C. Huang; C. Y. Wu; M. S. Chen; Y. C. Cheng; O. Cheng

doi:https://doi.org/10.7567/SSDM.2011.P-3-3

[P-3-3] Investigation of Temperature Dependence on DC and Low-Frequency Noise Characteristics in Uniaxial Tensile Strained nMOSFETs

S. C. Tsai¹, S. L. Wu², J. F. Chen¹, S. J. Chang¹, C. Y. Chang¹, P. C. Huang¹, C. Y. Wu², M. S. Chen³, Y. C. Cheng³, O. Cheng³ (1.National Cheng Kung Univ., 2.Cheng Shiu Univ., 3.United Microelectronics Corp. , Taiwan)

https://doi.org/10.7567/SSDM.2011.P-3-3

2011 International Conference on Solid State Devices and Materials

[P-3-3] Investigation of Temperature Dependence on DC and Low-Frequency Noise Characteristics in Uniaxial Tensile Strained nMOSFETs