Investigation of Temperature Dependence on DC and Low-Frequency Noise Characteristics in Uniaxial Tensile Strained nMOSFETs

S. C. Tsai; S. L. Wu; J. F. Chen; S. J. Chang; C. Y. Chang; P. C. Huang; C. Y. Wu; M. S. Chen; Y. C. Cheng; O. Cheng

doi:https://doi.org/10.7567/SSDM.2011.P-3-3

[P-3-3] Investigation of Temperature Dependence on DC and Low-Frequency Noise Characteristics in Uniaxial Tensile Strained nMOSFETs

S. C. Tsai¹、S. L. Wu²、J. F. Chen¹、S. J. Chang¹、C. Y. Chang¹、P. C. Huang¹、C. Y. Wu²、M. S. Chen³、Y. C. Cheng³、O. Cheng³ (1.National Cheng Kung Univ.、2.Cheng Shiu Univ.、3.United Microelectronics Corp. , Taiwan)

https://doi.org/10.7567/SSDM.2011.P-3-3

2011 International Conference on Solid State Devices and Materials

[P-3-3] Investigation of Temperature Dependence on DC and Low-Frequency Noise Characteristics in Uniaxial Tensile Strained nMOSFETs