[P-8-15] Characterization of GaGdN/AlGaN/GaGdN Triple-layer Structures with High Gd Concentration for Tunneling Magnetoresistance Devices
K. Higashi1、D. Abe1、Y. Mitsuno1、S. Komori1、S. Sano1、S. Hasegawa1、H. Asahi1
(1.Osaka Univ. , Japan)
https://doi.org/10.7567/SSDM.2011.P-8-15