[P-8-15] Characterization of GaGdN/AlGaN/GaGdN Triple-layer Structures with High Gd Concentration for Tunneling Magnetoresistance Devices
K. Higashi1, D. Abe1, Y. Mitsuno1, S. Komori1, S. Sano1, S. Hasegawa1, H. Asahi1
(1.Osaka Univ. , Japan)
https://doi.org/10.7567/SSDM.2011.P-8-15