[B-7-3] Set Voltage Statistics in Unipolar HfO2-Based RRAM

S. Long^1,2, C. Cagli³, J. Buchley³, Q. Liu¹, H. Lv¹, X. Lian², E. Miranda², D. Jimenez², M. Liu¹, J. Sune² (1.Inst. of Microelectronics, Chinese Academy of Sciences , China, 2.Universitat Autonoma de Barcelona , Spain, 3.CEA, LETI , France)

https://doi.org/10.7567/SSDM.2012.B-7-3