Statistical Analysis of Subthreshold Swing in Fully Depleted Silicon-on-Thin-BOX (SOTB) MOSFETs and Bulk MOSFETs

T. Mizutani; Y. Yamamoto; H. Makiyama; T. Tsunomura; T. Iwamatsu; H. Oda; N. Sugii; T. Hiramoto

doi:https://doi.org/10.7567/SSDM.2012.E-6-2

2012 International Conference on Solid State Devices and Materials

Sep 25, 2012 - Sep 27, 2012
Kyoto International Conference Center, Kyoto, Japan

[E-6-2] Statistical Analysis of Subthreshold Swing in Fully Depleted Silicon-on-Thin-BOX (SOTB) MOSFETs and Bulk MOSFETs

T. Mizutani¹, Y. Yamamoto², H. Makiyama², T. Tsunomura², T. Iwamatsu², H. Oda², N. Sugii², T. Hiramoto¹ (1.Univ. of Tokyo, 2.Low-power Electronics Association & Project , Japan)

https://doi.org/10.7567/SSDM.2012.E-6-2

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