Low frequency noise assessment of accumulation Si p-MOSFETs

P. Gaubert; A. Teramoto; S. Sugawa; T. Ohmi

doi:https://doi.org/10.7567/SSDM.2012.E-8-4

2012 International Conference on Solid State Devices and Materials

2012年9月25日〜 2012年9月27日
Kyoto International Conference Center, Kyoto, Japan

[E-8-4] Low frequency noise assessment of accumulation Si p-MOSFETs

P. Gaubert¹、A. Teramoto¹、S. Sugawa^1,2、T. Ohmi¹ (1.New Industry Creation Hatchery Center, Tohoku Univ.、2.Graduate School of Engineering, Tohoku Univ. , Japan)

https://doi.org/10.7567/SSDM.2012.E-8-4

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