The Japan Society of Applied Physics

[E-8-4] Low frequency noise assessment of accumulation Si p-MOSFETs

P. Gaubert1, A. Teramoto1, S. Sugawa1,2, T. Ohmi1 (1.New Industry Creation Hatchery Center, Tohoku Univ., 2.Graduate School of Engineering, Tohoku Univ. , Japan)

https://doi.org/10.7567/SSDM.2012.E-8-4