[H-4-2] Spectroscopic detection of medium range order in device-grade a-Si:H: dangling bond defects, and the Staebler-Wronski Effect

G. Lucovsky¹、G. N. Parsons¹、D. Zeller¹、J. Kim¹ (1.NC State Univ. , USA)

https://doi.org/10.7567/SSDM.2012.H-4-2